@Article{SilvaNetoRossSilv:2012:ApPZDi,
               author = "Silva Neto, Lauro Paulo da and Rossi, Jos{\'e} Osvaldo and Silva, 
                         A. R.",
          affiliation = "{} and {Instituto Nacional de Pesquisas Espaciais (INPE)}",
                title = "Applications of PZT Dielectric Ceramics in High-Energy Storage 
                         Systems",
              journal = "Materials Science Forum. Advanced Powder Technology VIII Book 
                         Series",
                 year = "2012",
               volume = "727-728",
                pages = "505--510",
                 note = "Setores de Atividade: Outras atividades profissionais, 
                         cient{\'{\i}}ficas e t{\'e}cnicas.",
             keywords = "ceramic, capacitor, PZT, breakdown voltage, dielectric constant.",
             abstract = "The barium and strontium titanate (BST) ceramics have been used 
                         with great success as excellent dielectrics in the construction of 
                         high voltage (HV) commercial ceramic capacitors with reduced 
                         dimensions because of their high dielectric constant. However, the 
                         main point of this paper is to investigate other type of ceramic 
                         known as PZT (Lead Zirconate Titanate) normally used as 
                         piezoelectric sensors in industrial applications. The idea herein 
                         is to use the PZT ceramics as HV dielectrics for applications in 
                         high-energy storage systems by de-poling their piezoelectric 
                         properties in order to avoid dielectric damage and losses at high 
                         frequencies. For this, de-poled PZT-4 ceramic samples (30 mm × 2 
                         mm) were submitted to HV tests, in which their dielectric 
                         breakdown strength and dielectric constant variation with the 
                         applied voltage were assessed. These results obtained confirmed 
                         the use of PZT in applications that require reasonable dielectric 
                         constant stability (< 15 %) with voltage and HV dielectric 
                         breakdown (40 kV/cm) for compact high-energy storage devices.",
                  doi = "10.4028/www.scientific.net/MSF.727-728.505",
                  url = "http://dx.doi.org/10.4028/www.scientific.net/MSF.727-728.505",
                 issn = "0255-5476",
                label = "lattes: 3979447098275675 1 SilvaNetoRossSilv:2012:ApPZDi",
             language = "en",
        urlaccessdate = "30 abr. 2024"
}